Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) studies of GaP and Si surfaces-Reference-Cited by-同舟云学术

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Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) studies of GaP and Si surfaces

Published:2002-04 Issue:2 Volume:65 Page:193-206
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Paparazzo E.,Moretto L.,Brolatti Massimo

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference41 articles.

1. Semiconductor surfaces and interfaces;Moench,1993

2. Briggs D, Seah MP, editors. Practical surface analysis, 2nd ed., vol. 1. Chichester, UK: Wiley, 1990.

3. Rivière JC, Myhra S, editors. Handbook of surface and interface analysis. New York: Marcel Dekker, 1998.

4. Modern Esca;Barr,1994

5. Microelectronics and semiconductors;Paparazzo,1998

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1. Role of surface energy on the morphology and optical properties of GaP micro & nano structures grown on polar and non-polar substrates;Applied Surface Science;2017-10

2. Nanoparticle Characterization;Nanoparticulate Materials;2012-10-05

3. Elementary Excitations of Electrons in Surficial Region of the Amorphous and Annealed Fe$_{73.6}$Cu$_{1}$Nb$_{2.4}$Si$_{15.8}$B$_{7.2}$;Uspehi Fiziki Metallov;2011-06-01

4. Low energy electron induced characteristic losses in the Fe73.6Cu1Nb2.4Si15.8B7.2 (FINEMET) alloy surface;Vacuum;2011-01

5. Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators;Journal of Electron Spectroscopy and Related Phenomena;2005-05

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