Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators-Reference-Cited by-同舟云学术

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Reflected electron energy loss microscopy (REELM) studies of metals, semiconductors and insulators

Published:2005-05 Issue:2-3 Volume:143 Page:219-231
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Paparazzo E.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference41 articles.

1. Scanning low energy electron loss microscopy (SLEELM)

2. Scanning Low Energy Electron Loss Microscopy (SLEELM): Au on Si

3. Analytical Electron Microscopy;Bevolo,1987

4. Electron Energy Loss Spectroscopy and Surface Vibrations;Ibach,1982

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative interpretation of the low-loss electron signal;Surface Science;2007-04

2. Recovering the past from surfaces and interfaces: experimental and cultural issues;Surface and Interface Analysis;2006

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