1. Correlation between density and structure. in boron nitride thin films by X-ray diffraction
2. Strain relaxation of boron nitride thin films on silicon
3. Pfeifer T, Welzel T, Kupfer H, Richter F, Willich P. Influence of aluminum additions on phase formation in boron nitride film deposition by magnetron sputtering. J Appl Phys, in preparation.
4. Glockner R. Materialprüfung mit Röntgenstrahlung. Berlin Heidelberg New York Tokyo: Springer, 1985. p. 422–31.
5. Prevéy PS. Developments in materials characterization technologies, In: VanderVoort G, Friel J, editors. Materials Park, OH: ASM International, 1996. p. 103–10.