Molecular excitation and relaxation of extreme ultraviolet lithography photoresists

Author:

Ogletree D. Frank

Publisher

Elsevier

Reference68 articles.

1. EUV radiation chemistry fundamentals: novel experiements and simulations;Ogletree,2015

2. Radiation chemistry in chemically amplified resists;Kozawa;Jpn J Appl Phys,2010

3. Electron transport for spectrum analysis and experiment design;Werner;J Electron Spectrosc,2010

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1. Role of resist components in electron emission and capture;International Conference on Extreme Ultraviolet Lithography 2023;2023-11-21

2. Organometallic and coordinative photoresist materials for EUV lithography and related photolytic mechanisms;Coordination Chemistry Reviews;2023-10

3. Damage-free X-ray spectroscopy characterization of oxide thin films;Applied Surface Science;2023-10

4. Atomic layer deposition and its derivatives for extreme ultraviolet (EUV) photoresist applications;Japanese Journal of Applied Physics;2023-06-01

5. Use of highly EUV absorbing element in chemically amplified resist;Advances in Patterning Materials and Processes XL;2023-05-01

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