Sticking probability of CN(X2Σ+) radicals onto amorphous carbon nitride films formed from the decomposition of BrCN induced by the microwave discharge flow of Ar-Reference-Cited by-同舟云学术

Sticking probability of CN(X2Σ+) radicals onto amorphous carbon nitride films formed from the decomposition of BrCN induced by the microwave discharge flow of Ar

Published:2012-02 Issue: Volume:86 Page:256-265
ISSN:1386-1425
Container-title:Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy

Author:

Ito Haruhiko,Araki Hitoshi,Wada Akira,Yamamoto Ayumi,Suzuki Tsuneo,Saitoh Hidetoshi

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference55 articles.

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5. Symmetry breaking in nitrogen-doped amorphous carbon: Infrared observation of the Raman-activeGandDbands

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