CdTe surface roughness by Raman spectroscopy using the 830nm wavelength-Reference-Cited by-同舟云学术

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CdTe surface roughness by Raman spectroscopy using the 830nm wavelength

Published:2006-09 Issue:1 Volume:65 Page:51-55
ISSN:1386-1425
Container-title:Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy

Author:

Frausto-Reyes C.,Molina-Contreras J. Rafael,Medina-Gutiérrez C.,Calixto Sergio

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference16 articles.

1. Interface modification of CdTe thin film solar cells by CdCl2-activation

2. Photoreflectance study in the E1 and E1+Δ1 transition regions of CdTe

3. Photoreflectance spectroscopy of CdTe(001) around E1 and E1+Δ1: linear electro-optic spectrum

4. Reflectance-difference study near the E1 and E1 + Δ1 transition regions of CdTe

5. Radiative behavior of negatively charged excitons in CdTe-based quantum wells: A spectral and temporal analysis

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