1. RF performance reliability of power N-LDMOS under pulsed-RF ife test in radar application;Belaïd;IET Circuits, Devices Syst.,2020
2. High-performance temperature control system for resistance furnace annealing and crystal growth of semiconductor compounds;Surus;Res. Eng.,2022
3. Thermal Annealing Effects on the Physical Properties of GaAsBi/GaAs/GaAs:Si Structure;Alazmi,2023
4. Study the effect of temperature variation and intrinsic layer thickness on the linear response of a PIN photodetector;Res. Eng.,2022
5. An RF stress-based thermal shock test method for a CMOS power amplifier;Shaouaz;Electron. Dev. Soc.,2021