Improving PCB defect detection using selective feature attention and pixel shuffle pyramid

Author:

Fung Ka ChunORCID,Xue Kai-Wen,Lai Cheung-Ming,Lin Kwan-Ho,Lam Kin-Man

Publisher

Elsevier BV

Reference43 articles.

1. Design of automated system for online inspection using the convolutional neural network (CNN) technique in the image processing approach;Ngo;Results in Engineering,2023

2. Anomaly detection in laser powder bed fusion using machine learning: a review;Sahar;Results in Engineering,2022

3. Segmentation-based deep-learning approach for surface-defect detection;Tabernik;J. Intell. Manuf.,2020

4. Wafer crack detection based on yolov4 target detection method;Li,2021

5. Yolov4: optimal speed and accuracy of object detection;Bochkovskiy;arXiv preprint arXiv:2004.10934,2020

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