Study of In0.48Ga0.52P/In0.2Ga0.8As/GaAs pseudomorphic high electron mobility transistor using a two-dimensional device simulator

Author:

Yoon S.F,Kam A.H.T,Gay B.P,Zheng H.Q,Ng G.I

Publisher

Elsevier BV

Subject

General Engineering

Reference16 articles.

1. Two-dimensional transient simulation of an idealized high electron mobility transistor;Widiger;IEEE Transactions on Electron Devices,1985

2. Scaling properties of high electron mobility transistors;Kizilyalli;IEEE Transactions on Electron Devices,1986

3. Scaling properties and short-channel effects in submicrometer algaas/gaas modfet’s: a Monte Carlo study;Kizilyalli;IEEE Transactions on Electron Devices,1993

4. Study of AlGaAs/InGaAs pseudomorphic HEMT using a two-dimensional device simulator;Yuan;Physica Status Solidus,1996

5. Y.C. Pao, K. Tran, M.F. Zybura, B. Ireton, Heterojunction device simulation for production phemt process control, GaAs MANTECH (1998), 119–121.

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