1. The determination of the noise, gain and scattering parameters of microwave transistors (HEMTs) using only an automatic noise figure test-set;Martines;IEEE Transactions Microwave Theory and Technology,1994
2. Comparison between two measuring methods for complete characterization of low-noise HEMTs at microwaves;Caddemi,1996
3. Temperature dependent noisy models of pseudomorphic HEMTs;Caddemi;International Journal of Computing Mathematics Electr. Electronic Engineering,1994
4. Microwave noise parameters of HEMTs vs. temperature by a simplified measurement procedure;Caddemi,1996
5. Comparative performance of the equivalent noise resistance of low-noise microwave FETs;Caddemi,1996