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Noise and speed characteristics of test transistors and charge amplifiers designed using a submicron CMOS technology

  • Published:1996-10 Issue:1-2 Volume:380 Page:350-352
  • ISSN:0168-9002
  • Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Santiard J.C,Faccio F

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference5 articles.

1. J.C. Santiard et al., Gasplex a low-noise analog signal processor for readout of gaseous detectors, CERN-ECP/94-17.

2. Analytical and experimental studies of thermal noise in MOSFET's

3. Z.Y. Chang, W.M.C. Sansen, Low-Noise Wide-Band Amplifiers in Bipolar and CMOS Technologies (Kluwer).

4. Limits of resolution of charge sensitive detector systems

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1. Noise Optimization of Charge Amplifiers With MOS Input Transistors Operating in Moderate Inversion Region for Short Peaking Times;IEEE Transactions on Nuclear Science;2007-06

2. Optimizing Drain Current, Inversion Level, and Channel Length in Analog CMOS Design;Analog Integrated Circuits and Signal Processing;2006-03-10

3. RX64DTH -a fully integrated 64-channel ASIC for a digital X-ray imaging system with energy window selection;IEEE Transactions on Nuclear Science;2005-08

4. Noise properties of a Se-based flat-panel x-ray detector with CMOS readout integrated circuits;SPIE Proceedings;2002-05-02

5. Prospects for charge sensitive amplifiers in scaled CMOS;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2002-03
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