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Submicron X-ray diffraction

Published:2001-07 Issue: Volume:467-468 Page:936-943
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

MacDowell A.A.,Celestre R.S.,Tamura N.,Spolenak R.,Valek B.,Brown W.L.,Bravman J.C.,Padmore H.A.,Batterman B.W.,Patel J.R.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

1. Stress generation by electromigration

2. Measurement of stress gradients generated by electromigration

3. Observations of electromigration induced void nucleation and growth in polycrystalline and near‐bamboo passivated Al lines

4. The Effect of Ti Interla Yer on the Hillock Formation of Al-0.5WT%Cu Films on the Tin/Ti/SiO2/Si Multilayer Structure

5. In-Situ Electromigration Damage of Al Interconnect Lines and the Influence of Grain Orientation

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