Downsizing of Johansson spectrometer for X-ray fluorescence trace analysis with brilliant undulator source-Reference-Cited by-同舟云学术

Downsizing of Johansson spectrometer for X-ray fluorescence trace analysis with brilliant undulator source

Published:2001-07 Issue: Volume:467-468 Page:1549-1552
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Sakurai Kenji,Eba Hiromi,Inoue Katsuaki,Yagi Naoto

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

1. C.J. Sparks Jr., in: H. Winick, S. Doniach (Eds.), Synchrotron Radiation Research, Plenum, New York, 1980 (Chapter 14), p. 459.

2. A. Iida, Y. Gohshi, in: S. Ebashi, M. Koch, E. Rubenstein (Eds.), Handbook on Synchrotron Radiation, Vol. 4, North-Holland, Amsterdam, 1991 (Chapter 9), p. 307.

3. K. Sakurai, H. Eba, Jpn. J. Appl. Phys., Suppl. 38 (1) (1999) 650.

4. Trace Chemical Characterization Using Monochromatic X-ray Undulator Radiation

5. T. Hara, T. Tanaka, T. Seike, T. Bizen, X. Marechal, T. Kohda, H. Kitamura, POS1-012, Nucl. Instr. and Meth. A 467–468 (2001), this proceedings.

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Watching nanomaterials with X-ray eyes: Probing different length scales by combining scattering with spectroscopy;Progress in Materials Science;2020-07

2. Determination of the electronic and structural configuration of coordination compounds by synchrotron-radiation techniques;Coordination Chemistry Reviews;2014-10

3. Low-dimensional systems investigated by x-ray absorption spectroscopy: a selection of 2D, 1D and 0D cases;Journal of Physics D: Applied Physics;2013-09-26

4. X-ray Fluorescence Spectrometry with Advanced Synchrotron X-ray Sources;Materia Japan;2013

5. Compact crystal spectrometers for ion microbeam WDX-PIXE applications;X-Ray Spectrometry;2011-03-28