Energy dependence of damage to Si PIN diodes exposed to β radiation

Author:

Lauber Jan A,Gascon-Shotkin Susan,Kellogg Richard G,Martinez German R

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Surface Thermal and Electric charge of PN Diode Expose by Soft Radiation Flash Exposure;Journal of Physics: Conference Series;2020-01-01

2. Electrical characterization of defects introduced in n-Ge during electron beam deposition or exposure;Journal of Applied Physics;2013-11-07

3. High-energy electron irradiation of different silicon materials;IEEE Transactions on Nuclear Science;2004-10

4. Observation of substrate-type inversion in high-resistivity silicon structures irradiated with high-energy electrons;IEEE Transactions on Nuclear Science;2003-02

5. Radiation damage of silicon structures with electrons of;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2002-06

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