Electrical characterization of defects introduced in n-Ge during electron beam deposition or exposure
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4828999
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4. Subthreshold Electron Damage inn-Type Germanium
5. Germanium: From its discovery to SiGe devices
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