Author:
Fleetwood Daniel M.,Winokur Peter S.,Barnes Charles E.,Shaw David C.
Reference22 articles.
1. Post irradiation effects in integrated circuits;Barnes,1991
2. A framework for an integrated set of standards for ionizing radiation testing of microelectronics;Brown;IEEE Trans. Nucl. Sci.,1987
3. Application of a model for treatment of time dependent effects of irradiation of microelectronic devices;Brown;IEEE Trans. Nucl. Sci.,1989
4. Response of advanced bipolar processes to ionizing radiation;Enlow;IEEE Trans. Nucl. Sci.,1991
5. A reevaluation of worst case postirradiation response for hardened MOS transistors;Fleetwood;IEEE Trans. Nucl. Sci.,1987
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22 articles.
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