Scanning electron acoustic microscopy of electronic materials-Reference-Cited by-同舟云学术

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Scanning electron acoustic microscopy of electronic materials

Published:1994-05 Issue:1-3 Volume:24 Page:209-212
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Piqueras J.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference18 articles.

1. L.J. Balk, in D.B. Holt and D.C. Joy (eds.), SEM Microcharacterization of Semiconductors, Academic Press, London, p.245

2. Be incorporation in heavily doped molecular beam epitaxy grown GaAs: Evidence of nonradiative behavior by cathodoluminescence and electron acoustic measurements

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Near-field Acoustic Microscopy of Functional Ceramics;Microstructure, Property and Processing of Functional Ceramics;2009

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