Author:
Labat N.,Danto Y.,Plano B.,Chambon M.,Dumas J.-M.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference7 articles.
1. Transmission Electron Microscopy of VLSI Circuits and Structures;Marcus,1983
2. High resolution electron microscopy of the GaAs/Si3N4 interface produced by multipolar plasma deposition;Ruterana;Appl. Phys. Lett.,1986
3. Lateral protrusions of ohmic contacts to AlGaAs/GaAs MODFET material;Ezis;Electron. Lett.,1987
4. An investigation of high temperature degradation of Ti/Pt/Au Schottky contacts to GaAs FETs using TEM technique;Magistrali,1991
5. Characteristics of Schottky diodes with microcluster interface;Schneider;Appl. Phys. Lett.,1983
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2 articles.
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