X-ray diffraction as a tool to study the mechanical behaviour of thin films

Author:

Kraft O,Hommel M,Arzt E

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference32 articles.

1. Deformation Mechanism Maps: The Plasticity and Creep of Metals and Ceramics;Frost,1982

2. Size effects in materials due to microstructural and dimensional constraints: a comparative review

3. Thin Films: Stresses and Mechanical Properties I–VIII. Mat. Res. Soc. Proc. Pittsburgh PA, USA, 1988–1998.

4. W.D. Nix, Met. Trans. A, 20A (1989) 2217.

5. The Stability of a Dislocation Threading a Strained Layer on a Substrate

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