Electron channeling contrast imaging of dislocation structures in deformed stoichiometric NiAl-Reference-Cited by-同舟云学术

Electron channeling contrast imaging of dislocation structures in deformed stoichiometric NiAl

Published:1997-12 Issue: Volume:239-240 Page:150-156
ISSN:0921-5093
Container-title:Materials Science and Engineering: A
language:en
Short-container-title:Materials Science and Engineering: A

Author:

Ng B.-C.,Simkin B.A.,Crimp M.A.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference24 articles.

1. TEM in-situ straining of NiAl

2. B. Ghosh, M.A. Crimp, in: W.O. Soboyejo, T.S. Srivastan, H.L. Fraser (Eds.), Deformation and Fracture of Ordered Intermetallics III, TMS, Warrendale, PA, 1996, pp. 349–358.

3. B.A. Simkin, M.A. Crimp, in: G.W. Bailey, J.M. Corbett, R.V.W. Dimlich, J.R. Michael, N.J. Zaluzec (Eds.), Proc. Microsc. Microanal. 1996, Minneapolis, MN, 11–15 August, 1996, pp. 140–141.

4. High resolution electron microscopy of defects in materials;Joy;MRS Proc.,1990

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