In-situ X-ray diffraction on functional thin films using a laboratory source during electrical biasing
Author:
Funder
CEA-DSM/DRT
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
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3. Unique piezoelectric properties of the monoclinic phase in Pb(Zr,Ti)O3 ceramics: large lattice strain and negligible domain switching;Fan;Phys. Rev. Lett.,2016
4. In situ 2D diffraction as a tool to characterize ferroelectric and piezoelectric thin films;Khamidy;Mater. Res. Express,2017
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1. Grain to grain heterogeneity in PZT thin films as probed by in situ biasing XRD;Journal of Applied Physics;2023-01-28
2. Effect of electrically induced cracks on the properties of PZT thin film capacitors;Applied Physics Letters;2022-12-05
3. Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction;Materials;2021-08-11
4. Recent Progresses in Nanometer Scale Analysis of Buried Layers and Interfaces in Thin Films by X-rays and Neutrons;Analytical Sciences;2020-08-10
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