Analytical prediction of subsurface microcrack damage depth in diamond wire sawing silicon crystal

Author:

Wang Liyuan,Gao Yufei,Li Xinying,Pu Tianzhao,Yin Youkang

Funder

National Natural Science Foundation of China

Natural Science Foundation of Shandong Province, China

Key Research and Development Program of Shandong Province, China

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference39 articles.

1. Effect of growth rate and wafering on residual stress of diamond wire sawn silicon wafers;Kumar;Procedia. Man.,2016

2. Fracture strength of silicon wafers sawn by fixed diamond wire saw;Liu;Sol. Energy,2017

3. Effect of crystal defects on mechanical properties relevant to cutting of multicrystalline solar silicon;Wu;Mater. Sci. Semicond. Process.,2013

4. Research of the cutting marks on diamond wire cut multicrystalline silicon wafers and the method to remove them;Chen;J. Synth. Cryst.,2014

5. Diamond wire sawing of solar silicon wafers: a sustainable manufacturing alternative to loose abrasive slurry sawing;Kumar;Procedia. Man.,2018

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