Structural analysis of polycrystalline silicon thin films produced by two different ICPCVD approaches-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Structural analysis of polycrystalline silicon thin films produced by two different ICPCVD approaches

Published:2018-03 Issue: Volume:75 Page:51-57
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Li Zhongli,Letha Ayra Jagadhamma,Wei Jia-Fu,Lu Man-Ling,Liu Yijian,Hwang Huey-Liang,Zhang Yafei

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference28 articles.

1. Review of thin-film silicon deposition techniques for high-efficiency solar cells developed at Panasonic/Sanyo

2. Growth of polycrystalline silicon on glass for thin-film solar cells

3. Characterization of silicon polycrystalline solar cells at cryogenic temperatures with ion beam-induced charge

4. High-quality polycrystalline silicon thin film prepared by a solid phase crystallization method

5. Sequential lateral solidification of thin silicon films on SiO2

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of He diluted plasma on the deposition of flexible low-temperature polycrystalline silicon thin film;Journal of Vacuum Science & Technology A;2023-12-29

2. P-type polycrystalline silicon seed layer fabrication using RF-PECVD for thin film solar cells;Materials Today: Proceedings;2022

3. Maintaining superior crystallinity and conductivity in boron-doped nc-Si ultra-thin films by hydrogen plasma treatment;Journal of Physics and Chemistry of Solids;2021-10

4. Short-circuit current density and fill factor improvement by optimizing In2O3:H and metal back reflector layers for p-i-n a-SiGe:H thin film solar cells;Journal of Materials Science: Materials in Electronics;2019-09-04

5. Double p-SiOx layers to improve the efficiency of p–i–n a-SiGe:H thin film solar cells;Journal of Materials Science: Materials in Electronics;2018-12-17

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3