Equivalent circuit analysis of Al/rGO-TiO2 metal-semiconductor interface via impedance spectroscopy: Graphene induced improvement in carrier mobility and lifetime-Reference-Cited by-同舟云学术

Equivalent circuit analysis of Al/rGO-TiO2 metal-semiconductor interface via impedance spectroscopy: Graphene induced improvement in carrier mobility and lifetime

Published:2018-08 Issue: Volume:82 Page:104-111
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Das Mrinmay,Datta Joydeep,Sil Sayantan,Dey Arka,Jana Rajkumar,Halder Soumi,Ray Partha Pratim

Funder

UGC, Government of India

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference46 articles.

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