Structural characterization and optical properties of pulsed laser deposition of Se75Te25 and Se75Te17Ge8 amorphous thin films-Reference-Cited by-同舟云学术

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Structural characterization and optical properties of pulsed laser deposition of Se75Te25 and Se75Te17Ge8 amorphous thin films

Published:2015-11 Issue: Volume:39 Page:172-177
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Salim S.M.,Lahmar A.,Zayied H.,Salem A.M.,Sakr G.B.,Teleb N.,El Marssi M.

Funder

Campus France

French Cultural Center in Cairo

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference31 articles.

1. Crystallization process in Ge2Sb2Te5 amorphous films

2. Direct observations of Ge2Sb2Te5 recording marks in the phase-change disk

3. Spectral features of Co–Ge–Te amorphous thin film

4. Effects of annealing on crystallization process in amorphous Ge5Se95−xTex thin films

5. Structural, optical and electrical characterization of amorphous SexTe1−x thin film alloys

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1. Synthesis and characterization of F-doped CdS thin films by spray pyrolysis for photovoltaic applications;Materials Research Express;2018-06-20

2. Influence of spray time on the optical and electrical properties of CoNi2S4 thin films;Materials Research Express;2018-04-11

3. Phase change studies in Se85In15−xZnx chalcogenide thin films;Journal of Applied Physics;2018-03-28

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