Substrate temperature dependent structural orientation of EBPVD deposited NiO films and its influence on optical, electrical property-Reference-Cited by-同舟云学术

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Substrate temperature dependent structural orientation of EBPVD deposited NiO films and its influence on optical, electrical property

Published:2018-03 Issue: Volume:75 Page:26-30
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Kuanr Sushil Kumar,Vinothkumar G.,Babu K. Suresh

Funder

DST-SERB

India and Central Instrumentation Facility

Pondicherry University

Rajiv Gandhi National Fellowship

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference35 articles.

1. Next-generation multifunctional electrochromic devices;Cai;Acc. Chem. Res.,2016

2. Structural, optical and electrical properties of sputtered NiO thin films for gas detection;Predanocy;Appl. Surf. Sci.,2017

3. Optoelectronic and electrochemical properties of nickel oxide (NiO) films deposited by DC reactive magnetron sputtering;Subramanian;Phys. B Condens. Matter,2008

4. Hole transfer dynamics from dye molecules to p-type NiO nanoparticles: effects of processing conditions;Wu;Phys. Chem. Chem. Phys.,2012

5. Structural and growth aspects of electron beam physical vapor deposited NiO-CeO2 nanocomposite films;Kuanr;J. Vac. Sci. Technol. A Vac. Surf. Film,2016

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3. Novel NiO surface coating on LiCoO2 cathode for Li-ion batteries;Materials Science and Engineering: B;2022-09

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