Electrical characterization of current conduction in Au/TiO2/n-Si at wide temperature range-Reference-Cited by-同舟云学术

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Electrical characterization of current conduction in Au/TiO2/n-Si at wide temperature range

Published:2009-12 Issue:6 Volume:12 Page:224-232
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Altuntas H.,Bengi A.,Aydemir U.,Asar T.,Cetin S.S.,Kars I.,Altindal S.,Ozcelik S.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference53 articles.

1. Structural, optical and Raman scattering studies on DC magnetron sputtered titanium dioxide thin films

2. Effect of total and oxygen partial pressures on structure of photocatalytic TiO2 films sputtered on unheated substrate

3. Low temperature growth of rutile TiO2 films in modified rf magnetron sputtering

4. Structural and electrical properties of TiO2 RF sputtered thin films

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2. Fabrication and Electrical Characterization of Ti/p-Si Metal Semiconductor Schottky Structures at Low Temperature;Journal of Electronic Materials;2022-09-30

3. Effect of TiO2 Thin Film with Different Dopants in Bringing Au-Metal into a Contact with n-Si;Journal of Inorganic and Organometallic Polymers and Materials;2022-01-21

4. Development of a hybrid photodetector device between pyruvic acid (CH3COCOOH) and silicon;Semiconductor Science and Technology;2021-08-31

5. Termal Buharlaştırma Yöntemiyle Hazırlanan Al/TiO2/p-Si Schottky Diyotun Elektriksel Özelliklerinin Sıcaklık ve Aydınlanma Şiddetine Bağlı İncelenmesi;Türk Doğa ve Fen Dergisi;2021-05-24

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