Measurement error caused by quarter-wave plate in the dynamic interferometer: Theory and correction method-Reference-Cited by-同舟云学术

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Measurement error caused by quarter-wave plate in the dynamic interferometer: Theory and correction method

Published:2022-01 Issue: Volume:502 Page:127406
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Zhu Ronggang^ORCID,Zhou Jianjie,Li Bo,Huang Ya^ORCID

Funder

National Natural Science Foundation of China

Natural Science Foundation of Jiangsu Province

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Dynamic interferometry;Brock;Proc. SPIE - Int. Soc. Opt. Eng.,2005

2. Measurement of mean thickness of transparent samples using simultaneous phase shifting interferometry with four interferograms;Muñoz;Appl. Opt.,2016

3. Single-wavelength phase retrieval method from simultaneous multi-wavelength in-line phase-shifting interferograms;Fei;Opt. Express,2014

4. Dynamic fizeau interferometer based on the lateral displacements of the point sources;Zhu;Opt. Lasers Eng.,2017

5. Dynamic imaging and analysis of transient mass transfer process using pixelated-array masked phase-shifting interferometry;Wu;Int. J. Heat Mass Transfer,2021

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