Experimental determination of the oxygen K-shell fluorescence yield using thin SiO 2 and Al 2 O 3 foils-Reference-Cited by-同舟云学术

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Experimental determination of the oxygen K-shell fluorescence yield using thin SiO 2 and Al 2 O 3 foils

Published:2016-10 Issue: Volume:124 Page:94-98
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Hönicke P.,Kolbe M.,Krumrey M.,Unterumsberger R.,Beckhoff B.

Funder

European Metrology Research Programme

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference21 articles.

1. Reference-free total reflection X-ray fluorescence analysis of semiconductor surfaces with synchrotron radiation;Beckhoff;Anal. Chem.,2007

2. Reference-free X-ray spectrometry based on metrology using synchrotron radiation;Beckhoff;J. Anal. At. Spectrom.,2008

3. A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies;Lubeck;Rev. Sci. Instrum.,2013

4. A plane-grating monochromator beamline for the PTB undulators at BESSY II;Senf;J. Synchrotron Radiat.,1998

5. Modelling the response function of energy dispersive X-ray spectrometers with silicon detectors;Scholze;X-Ray Spectrom.,2009

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