Author:
Hönicke P.,Beckhoff B.,Kolbe M.,List S.,Conard T.,Struyff H.
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference19 articles.
1. Advanced metrologies for cleans characterization: ARXPS, GIXF and NEXAFS;Conard;Solid State Phen.,2008
2. G. Zschätzsch, Development of a XPS metrology to analyse the sidewalls of etched trench structures, Diploma Thesis, TU Dresden, 2007.
3. Reference-free total reflection X-ray fluorescence analysis of semiconductor surfaces with synchrotron radiation;Beckhoff;Anal. Chem.,2007
4. A plane-grating monochromator beamline for the PTB undulators at BESSY II;Senf;J. Synchrotron Radiat.,1998
5. Total-Reflection X-Ray Fluorescence Analysis;Klockenkämper,1997
Cited by
13 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献