Emergence and consequences of lateral sample heterogeneity in glow discharge spectrometry-Reference-Cited by-同舟云学术

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Emergence and consequences of lateral sample heterogeneity in glow discharge spectrometry

Published:2016-12 Issue: Volume:126 Page:37-43
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Storey Andrew P.,Ray Steven J.,Hoffmann Volker,Voronov Maxim,Engelhard Carsten,Buscher Wolfgang,Hieftje Gary M.

Funder

U.S. Department of Energy

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference41 articles.

1. Depth profiling of thin films using a Grimm-type glow discharge lamp;Bengtson;Thin Solid Films,1985

2. Application of glow discharge optical emission spectroscopy to study semiconductors and semiconductor devices;Dharmadasa;Semicond. Sci. Technol.,1995

3. Glow discharge spectroscopy for depth profile analysis: from micrometer to sub-nanometer layers;Pisonero;Anal. Bioanal. Chem.,2006

4. Sputtering in a glow discharge for spectrochemical analysis;Boumans;Anal. Chem.,1972

5. A contribution to the solution of the problem of quantification in surface analysis work using glow discharge atomic emission spectroscopy;Bengtson;Spectrochim. Acta B,1985

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of the intensity dependence of glow discharge mass spectrometry quantification on the discharge parameters;Journal of Analytical Atomic Spectrometry;2019

2. Atomic spectrometry update: review of advances in atomic spectrometry and related techniques;Journal of Analytical Atomic Spectrometry;2018

3. Depth profiling of nanometer thin layers by laser desorption and laser postionization time-of-flight mass spectrometry;Journal of Analytical Atomic Spectrometry;2017

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