Quantification of modifiers in advanced materials based on zinc oxide by total reflection X-ray fluorescence and inductively coupled plasma mass spectrometry
Author:
Funder
Lomonosov Moscow State University
Publisher
Elsevier BV
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference12 articles.
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4. Sample pretreatment strategies for total reflection X-ray fluorescence analysis: a tutorial review;De La Calle;Spectrochim. Acta B At. Spectrosc.,2013
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