Quantification of modifiers in advanced materials based on zinc oxide by total reflection X-ray fluorescence and inductively coupled plasma mass spectrometry-Reference-Cited by-同舟云学术

Quantification of modifiers in advanced materials based on zinc oxide by total reflection X-ray fluorescence and inductively coupled plasma mass spectrometry

Published:2016-04 Issue: Volume:118 Page:62-65
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Filatova Daria G.,Alov Nikolai V.,Vorobyeva Natalia A.,Rumyantseva Marina N.,Sharanov Pavel Yu.,Seregina Irina F.^ORCID,Gaskov Alexander M.

Funder

Lomonosov Moscow State University

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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4. Sample pretreatment strategies for total reflection X-ray fluorescence analysis: a tutorial review;De La Calle;Spectrochim. Acta B At. Spectrosc.,2013

5. Production of the ideal sample shape for total reflection X-ray fluorescence analysis;Horntrich;Spectrochim. Acta B At. Spectrosc.,2012

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