A simple and precise total reflection X-ray fluorescence spectrometer: construction and its applications-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A simple and precise total reflection X-ray fluorescence spectrometer: construction and its applications

Published:2004-08 Issue:8 Volume:59 Page:1141-1147
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Tiwari M.K.,Sawhney K.J.S.,Gowri Sankar B.,Raghuvanshi V.K.,Nandedkar R.V.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference28 articles.

1. Elemental analysis of environmental samples by total reflection X-ray fluorescence: a review;Klockenkamper;X-ray Spectrom,1996

2. A new spectrometer for total reflection X-ray fluorescence analysis of light elements;Streli;Nucl. Instr. Methods A,1993

3. Determination of trace elements in rainwater by total-reflection X-ray fluorescence;Stossel;Anal. Chem,1985

4. Synchrotron radiation-excited glancing incidence XRF for depth profile and thin film analysis of light elements;Kregsamer;X-ray Spectrom,1999

5. Depth profiles of a shallow implanted layer in a Si wafer determined by different methods of thin layer analysis;Klockenkamper;Spectrochim. Acta Part B,2002

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Formation of nanoparticles, nanoholes, nanoripples, and nanowires using different conditions of laser–matter interaction;Nanostructured Nonlinear Optical Materials;2018

2. Intelligent Simultaneous Quantitative Online Analysis of Environmental Trace Heavy Metals with Total-Reflection X-Ray Fluorescence;Sensors;2015-05-06

3. Development and Characterization of a Portable Total Reflection X-ray Fluorescence System Using a Waveguide for Trace Elements Analysis;Analytical Sciences;2014

4. Laser Ablation Induced Cluster Formation;Springer Series in Optical Sciences;2013

5. Nanomaterials: Laser-Based Processing in Gas Phase;Nanomaterials;2012-08-23

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3