Challenges of total reflection X-ray fluorescence for surface- and thin-layer analysis-Reference-Cited by-同舟云学术

Challenges of total reflection X-ray fluorescence for surface- and thin-layer analysis

Published:2006-11 Issue:10-11 Volume:61 Page:1082-1090
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Klockenkämper R.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference42 articles.

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3. The Laboratory Life Science and Analytical Instrumentation Industry;Global Assessment Report,2004

4. The role of total reflection X-ray fluorescence in atomic spectroscopy;Tölg;Spectrochim. Acta Part B,1993

5. Whole surface analysis of semi-conductor wafers by accumulating short-time mapping data of total reflection X-ray fluorescence spectrometry;Mori;Anal. Chem.,2002

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