Developing a sampling plan by variables inspection for controlling lot fraction of defectives
Author:
Funder
National Science Council of Taiwan, ROC
Ministry of Education, Taiwan, ROC
Publisher
Elsevier BV
Subject
Applied Mathematics,Modeling and Simulation
Reference13 articles.
1. Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives;Pearn;Omega – The International Journal of Management Science,2006
2. A variables sampling plan based on Cpmk for product acceptance determination;Wu;Eur. J. Oper. Res.,2008
3. Introduction to Statistical Quality Control;Montgomery,2009
4. Variables sampling inspection scheme for resubmitted lots based on the process capability index Cpk;Wu;Eur. J. Oper. Res.,2012
5. Quality-yield measure for production with very low fraction of defectives;Pearn;Int. J. Prod. Res.,2004
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