An efficient partial sampling inspection for lot sentencing based on process yield-Reference-Cited by-同舟云学术

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An efficient partial sampling inspection for lot sentencing based on process yield

Published:2023-04-19 Issue: Volume: Page:
ISSN:0254-5330
Container-title:Annals of Operations Research
language:en
Short-container-title:Ann Oper Res

Author:

Liu Shih-Wen^ORCID,Wu Chien-Wei^ORCID

Funder

Ministry of Science and Technology, Taiwan

Publisher

Springer Science and Business Media LLC

Subject

Management Science and Operations Research,General Decision Sciences

Link

https://link.springer.com/content/pdf/10.1007/s10479-023-05341-2.pdf

Reference51 articles.

1. Arizono, I., Yoshimoto, K., & Tomohiro, R. (2020). Variable stage-independent double sampling plan with screening for acceptance quality loss limit inspection scheme. International Journal of Production Research, 58(8), 2550–2559.

2. Aslam, M., Balamurali, S., Jun, C. H., Ahmad, M., & Rasool, M. (2012). Optimal designing of an SkSP-V skip-lot sampling plan with double-sampling plan as the reference plan. The International Journal of Advanced Manufacturing Technology, 60, 733–740.

3. Aslam, M., Wu, C. W., Jun, C. H., Azam, M., & Itay, N. (2013a). Developing a variables repetitive group sampling plan based on process capability index Cpk with unknown mean and variance. Journal of Statistical Computation and Simulation, 83(8), 1507–1517.

4. Aslam, M., Balamurali, S., Jun, C. H., & Rasool, M. (2013b). Optimal designing of skip-lot sampling plan of type SkSP-2 with group acceptance sampling plan as reference plan under Burr-type XII distribution. Journal of Statistical Computation and Simulation, 83(1), 37–51.

5. Balanurali, S., Aslam, M., & Jun, C. H. (2014). A new system of skip-lot sampling plans including resampling. The Scientific World Journal, 192412, 1–6.

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1. An improved skip-lot sampling scheme with resampling mechanism using an advanced capability index;International Journal of Production Research;2024-05-28

2. A double sampling plan for truncated life tests under two-parameter Lindley distribution;Annals of Operations Research;2024-04-08

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