Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution

Author:

Xu Tian-Qun,Chen Yue-Peng

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Publisher

Elsevier BV

Subject

Applied Mathematics,Modelling and Simulation

Reference17 articles.

1. A Bayes zero-failure (BAZE) reliability demonstration testing procedure;Martz;Qual. Technol.,1979

2. Bayes estimation for the linear model;Lindley;R. Stat. Soc. – Ser. B,1972

3. The hierarchical Bayesian analysis of zero-failure data of exponential distribution;Han;Chin. Appl. Stat. Manage.,1998

4. Markov chain Monte Carlo method and its application;Brooks;The Statistician,1998

5. E-Bayesian estimation and hierarchical Bayesian estimation of failure rate;Han;Appl. Math. Model.,2009

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