Design for Manufacturability and Yield-Reference-Cited by-同舟云学术

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Design for Manufacturability and Yield

Published:2008 Issue: Volume: Page:423-461
ISSN:
Container-title:System-on-Chip Test Architectures
language:
Short-container-title:

Author:

Aitken Robert C.

Publisher

Elsevier

Reference38 articles.

1. Defect-oriented testing, Chapter 1;Aitken,2006

2. The Science and Engineering of Microelectronic Fabrication;Campbell,2001

3. Fundamentals of Semiconductor Manufacturing and Process Control;May,2006

4. Handbook of Semiconductor Manufacturing Technology,2000

5. CMOS Electronics: How It Works, How It Fails;Segura,2004

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Extreme Value Theory: Application to Memory Statistics;Extreme Statistics in Nanoscale Memory Design;2010

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