Author:
Yilmaz E.,Kahraman A.,McGarrigle A.M.,Vasovic N.,Yegen D.,Jaksic A.
Funder
Abant Izzet Baysal University
Ministry of Development of Turkey
Reference21 articles.
1. The use of charge pumping currents to measure surface state densities in MOS transistors;Eliot;Solid State Electron.,1976
2. A reliable approach to charge-pumping measurements in MOS transistors;Groeseneken;IEEE Trans. Electron Dev. ED,1984
3. The space charge dosimeter;Holmes-Siedle;Nucl. Instrum. Methods Phys. Res. B,1974
4. The dosimetric performance of RadFETS in radiation test beams;Holmes-Siedle;IEEE Radiat. Eff. Data Workshop,2007
5. Gamma-ray irradiation and post-irradiation responses of high dose range RADFETs;Jaksic;IEEE Trans. Nucl. Sci.,2002
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