Thickness measurement of organic films using Compton scattering of characteristic X-rays
Author:
Publisher
Elsevier BV
Subject
Radiation
Reference19 articles.
1. Berger, M.J., Hubbell, J.H., 1987/1999. XCOM: Photon cross sections database, web version 1.2, available at 〈http://physics.nist.gov/xcom〉. National Institute of Standards and Technology, Gaithersburg, MD 20899, USA, Originally published as NBSIR 87-3597 XCOM: Photon cross sections on a personal computer.
2. SiO2 thickness determination by X-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering, transmission electron microscopy, and ellipsometry;Cole;J. Vac. Sci. Technol. B,2000
3. Determination of thicknesses and interface roughnesses of GaAs-based and InAs/AlSb-based heterostructures by X-ray reflectometry;Durand;Mater. Sci. Semicond. Process,2001
4. Determination of the thickness of coatings by means of a new XRF spectrometer;Fiorini;X-Ray Spectrom.,2002
5. A semi-empirical model for a 90 Sr beta-particle transmission thickness gage for aluminum alloys;Gardner;Nucl. Instrum. Methods B,2004
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Determining the thickness of a thin aluminum sheet using the transmission measurement of X-rays with varying energies: A comparative analysis between calibration curve fitting and artificial neural network approaches;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-11
2. X-ray fluorescence analysis of solid-state films, layers, and coatings;Radiation Physics and Chemistry;2022-08
3. Preparation of Sample for X‐Ray Fluorescence Analysis;X‐Ray Fluorescence in Biological Sciences;2022-04-04
4. Thickness measurement method for the thermal protection layer of a solid rocket motor based on a laser point cloud;Insight - Non-Destructive Testing and Condition Monitoring;2022-04-01
5. Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement;Nuclear Engineering and Technology;2021-04
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3