In-situ and elementally resolved determination of the thickness uniformity of multi-ply films by confocal micro XRF-Reference-Cited by-同舟云学术

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In-situ and elementally resolved determination of the thickness uniformity of multi-ply films by confocal micro XRF

Published:2014-08 Issue: Volume:90 Page:84-88
ISSN:0969-8043
Container-title:Applied Radiation and Isotopes
language:en
Short-container-title:Applied Radiation and Isotopes

Author:

Peng Song,Liu Zhiguo,Sun Tianxi,Wang Guangfu,Ma Yongzhong,Ding Xunliang

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Publisher

Elsevier BV

Subject

Radiation

Reference24 articles.

1. Comparison of mammography radiation dose values obtained from direct incident air kerma measurements with values from measured X-ray spectral data;Assiamah;Appl. Radiat. Isot,2005

2. Estimation of dosimetry parameters for an EB accelerator using graphite calorimeters of different thickness;Benny;Nucl. Instrum. Methods Phys. Res. A,2012

3. Comparative study of non-destructive methods to quantify thickness of tablet coatings;Cahyadi;Int. J. Pharm.,2010

4. An examination of mass thickness measurements with X-ray sources;Chen;Appl. Radiat. Isot.,2008

5. Bilayer thickness mismatch controls domain size in model membranes;Heberle;J. Am. Chem. Soc.,2013

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