Investigation of grain boundary grooves at the solid–liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging-Reference-Cited by-同舟云学术

Investigation of grain boundary grooves at the solid–liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging

Published:2013-08 Issue: Volume:377 Page:203-211
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Tandjaoui Amina,Mangelinck-Noel Nathalie,Reinhart Guillaume,Billia Bernard,Lafford Tamzin,Baruchel José

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference22 articles.

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3. Optimization of silicon crystallization in a Bridgman growth furnace by numerical modelling;Bellman;Journal of Crystal Growth,2013

4. An optical microscopy study of dislocations in multicrystalline silicon grown by directional solidification method;Chen;Materials Science in Semiconductor Processing,2010

5. An enhanced cooling design in directional solidification for high quality multi-crystalline solar silicon;Li;Journal of Crystal Growth,2012

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