Structural and optical properties of polycrystalline thin films of rare earth oxides grown on fused quartz by low pressure MOCVD
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference24 articles.
1. Comparison of the chemical and physical properties of f-element metals and oxides: their dependence on electronic properties
2. Dielectric constants of binary rare-earth compounds
3. Interfacial reactions between thin rare-earth-metal oxide films and Si substrates
4. Characteristics of electron-beam-gun-evaporated Er2O3 thin films as gate dielectrics for silicon
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