Defect characterization for epitaxial HgCdTe alloys by electron microscopy

Author:

Aoki T.,Chang Y.,Badano G.,Zhao J.,Grein C.,Sivananthan S.,Smith David J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Cited by 43 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Preparation and characterization of large-sized CdZnTe epitaxial single crystal;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-11

2. The 'swallow-tailed defect' in MBE HgCdTe film;J INFRARED MILLIM W;2020

3. Interface Studies in HgTe/HgCdTe Quantum Wells;physica status solidi (b);2020-02-11

4. Surface defects of Liquid Phase Epitaxial growth of HgCdTe film induced by Te-rich precipitates in CdZnTe substrates;J INFRARED MILLIM W;2018

5. Impurity ‘Hot Spots’ in MBE HgCdTe/CdZnTe;Journal of Electronic Materials;2018-07-20

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