Comprehensive characterization of MOVPE-grown AlGaAs/AlAs distributed Bragg reflector structures by optical reflectance, X-ray diffraction and atomic force microscopy-Reference-Cited by-同舟云学术

Comprehensive characterization of MOVPE-grown AlGaAs/AlAs distributed Bragg reflector structures by optical reflectance, X-ray diffraction and atomic force microscopy

Published:2005-02 Issue:3-4 Volume:274 Page:331-338
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Bhattacharya A.,Nasarek M.,Zeimer U.,Klein A.,Zorn M.,Bugge F.,Gramlich S.,Weyers M.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference12 articles.

1. Design, fabrication, and performance of infrared and visible vertical-cavity surface-emitting lasers

2. Metalorganic vapor phase epitaxial growth of red and infrared vertical-cavity surface-emitting laser diodes

3. MOVPE growth of visible vertical-cavity surface-emitting lasers (VCSELs)

4. MOVPE process development for 650nm VCSELS using optical in-situ techniques

5. F. Abelès, Ann. de Physique, 5 (1950) 596 and 706

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