Characterization of defect patterns in Cz silicon slabs by carrier densityimaging
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference23 articles.
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3. Grown-in microdefects, residual vacancies and oxygen precipitation bands in Czochralski silicon;Voronkov;Journal of Crystal Growth,1999
4. Vacancy-type microdefect formation in Czochralski silicon;Voronkov;Journal of Crystal Growth,1998
5. Characterization of swirl defects in floating-zone silicon crystals;Petroff;Journal of Crystal Growth,1975
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