Optical testing method analysis of carrier transport in GaAs PCSS-Reference-Cited by-同舟云学术

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Optical testing method analysis of carrier transport in GaAs PCSS

Published:2020-12 Issue: Volume:182 Page:109771
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Luan Chongbiao,Zhao Juan,Li Hongtao,Xiao Longfei,Wang Chuanwei,Xiao Jinshui,Ma Xun,Xu Xiangang,Huang Yupeng

Funder

Rector's fund of China Academy of Engineering Physics

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference21 articles.

1. Sublinear current-voltage characteristics of linear photoconductive semiconductor switch;Cui;IEEE Electron. Device Lett.,2016

2. Analysis of intensity dependent near bandedge absorption in semi-insulating 4H-SiC for photoconductive switch applications;Meyers;J. Phys. D Appl. Phys.,2017

3. 1.23ns pulse width of quenched high gain GaAs photoconductive semiconductor switch at 8nJ excitation;Xu;IEEE Electron. Device Lett.,2016

4. Synchronization of two GaAs photoconductive semiconductor switches triggered by two laser diodes;Xu;Opt. Lett.,2016

5. A low leakage 10000V silicon photoconductive switch;Koo;Appl. Phys. Lett.,1984

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