Interface formation of Al2O3 on carbon enriched 6H-SiC(0001): Photoelectron spectroscopy studies
Author:
Funder
University of Wroclaw
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference51 articles.
1. Advanced processing for mobility improvement in 4H-SiC MOSFETs: a review;Cabello;Mater. Sci. Semicond. Process.,2018
2. SiC power devices - present status, applications and future perspective;Ostling;Proc. Int. Symp. Power Semicond. Dev. ICs,2011
3. Comparison of static and switching characteristics of 1200 V 4H-SiC BJT and 1200 V Si-IGBT;Gao;IEEE Trans. Ind. Appl.,2008
4. High-power modular multilevel converters with SiC JFETs;Peftitsis;IEEE Trans. Power Electron.,2012
5. Characterization of nitrogen-doped amorphous silicon carbide thin films;Ŝafránková;Vacuum,1998
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