Synchrotron analysis of structure transformations in V and V/Ag thin films-Reference-Cited by-同舟云学术

Synchrotron analysis of structure transformations in V and V/Ag thin films

Published:2018-04 Issue: Volume:150 Page:186-195
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Orlov A.K.^ORCID,Kruhlov I.O.^ORCID,Shamis O.V.,Vladymyrskyi I.A.,Kotenko I.E.,Voloshko S.M.,Sidorenko S.I.^ORCID,Ebisu T.,Kato K.,Tajiri H.,Sakata O.,Ishikawa T.

Funder

RIKEN SPring-8 Center

National Technical University of Ukraine

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference33 articles.

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