Plasmons in double interfaces system of Si3N4/SiO2/Si irradiated by 60Co
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference15 articles.
1. Electrical breakdown in thin gate and tunneling oxides
2. On physical models for gate oxide breakdown
3. A characterization model for ramp-voltage-stressed I-V characteristics of thin thermal oxides grown on silicon substrate
4. The effect of gate metal and SiO2thickness on the generation of donor states at the Si‐SiO2interface
5. Fischetti MV. Insulating films on semiconductors. In: Simonne JJ, editor. Amsterdam: North-Holland; 1986. p. 186.
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